RELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS - JOHNSTON ALLAN H

Business Listing - October 16, 2023

RELIABILITY AND RADIATION EFFECTS IN COMPOUND SEMICONDUCTORS - JOHNSTON ALLAN H

AUTHOR AFFILIATION : CALIFORNIA INST OF TECHNOLOGY, USA PUB DATE : 27-Apr-10 ONLINE RELEASE DATE : 25-Oct-10 Print ISBN 13 : 9789814277105 US$ (Print) : 135 EISBN 13 : 9789814277112 US$ (Ebook) : 216 £ (Ebook) : 190 SUBJECT : ENGINEERING / ACOUSTICS SUB SUBJECT : CIRCUITS & SYSTEMS IMPRINT : WSPC Package : WSPC Collection Year : 2010 URL : https://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc BOOK TYPE : MONOGRAPH PP : 376 BOOK CODE : 7331  

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