OXIDE RELIABILITY: A SUMMARY OF SILICON OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY - DUMIN D J

Business Listing - October 16, 2023

OXIDE RELIABILITY: A SUMMARY OF SILICON OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY - DUMIN D J

AUTHOR AFFILIATION : CLEMSON UNIV, USA PUB DATE : 18-Jan-02 ONLINE RELEASE DATE : 15-Apr-10 Print ISBN 13 : 9789810248420 US$ (Print) : 129 EISBN 13 : 9789812778062 US$ (Ebook) : 206 £ (Ebook) : 170 SUBJECT : MATERIALS SCIENCE SUB SUBJECT : MICROELECTRONICS IMPRINT : WSPC Package : WSPC Collection Year : Backlist URL : https://www.worldscientific.com/worldscibooks/10.1142/4880#t=toc SELECTED TOPICS IN ELECTRONICS AND SYSTEMS BOOK TYPE : REVIEW VOLUME PP : 280 BOOK CODE : 4880  

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